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By Kashin B.S., Korneichuk N.P., Ul'yanov P.I.
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Additional resources for A Brief Survey of Scientific Results of E. A. Storozhenko
A narrow slit provides the best energy resolution (limited by spectrometer aberrations and by the energy width of the electron source, typically 1–2 eV) but gives the lowest amount of signal, so is more suitable for recording low energy losses. To record inner-shell edges, a wider slit may be necessary to obtain data which are not dominated by shot noise. A plastic scintillator allows pulse counting up to several MHz but suffers from radiation damage and must be changed or mechanically shifted from time to time.
13], causing the signal/background ratio to be less than expected. Because this spectrometer background arises mainly from backscattering of the intense zero-loss beam, it is more noticeable in very thin specimens, for which the signal/background ratio may actually be lower than at moderate thickness; see Fig. 11b. Fig. 11 Thickness dependence of the K -loss signal/background ratio (with 100 eV integration window) for (a) amorphous carbon and (b) crystalline silicon. Data points are experimental values, recorded with β = 10 mrad and E0 = 120 kV; the curves were calculated by convolving power-law edge and background proﬁles with a delta-function approximation of the low-loss spectrum.
1) where r is the radius of the incident beam at the specimen and R is the SEA radius. Taking R = 1 mm and bc = 100 nm, this condition can be fulﬁlled (with r > 0) only if Mvs < 104 . In this case, the area of analysis is being selected (at the specimen plane) by the incident probe, the small value of r required being obtained by operating the TEM in a small-probe mode. Fig. 7 Proﬁles of electron intensity at the plane of the spectrometer entrance aperture, without (solid lines) and with (dashed lines) chromatic aberration of postspecimen lenses.
A Brief Survey of Scientific Results of E. A. Storozhenko by Kashin B.S., Korneichuk N.P., Ul'yanov P.I.